fix test_multisig_descriptor_export

This commit is contained in:
scgbckbone 2023-05-15 11:57:20 +02:00 committed by doc-hex
parent 6f4b4f6363
commit 9401bcd31a

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@ -2715,7 +2715,7 @@ def test_ms_xpub_ordering(descriptor, m_n, clear_ms, make_multisig, import_ms_wa
@pytest.mark.parametrize('cmn_pth_from_root', [True, False])
@pytest.mark.parametrize('way', ["sd", "vdisk", "nfc"])
@pytest.mark.parametrize('M_N', [(3, 5), (2, 3), (15, 15), (32, 32)])
@pytest.mark.parametrize('addr_fmt', [AF_P2TR])
@pytest.mark.parametrize('addr_fmt', [AF_P2WSH, AF_P2SH, AF_P2WSH_P2SH, AF_P2TR])
def test_multisig_descriptor_export(M_N, way, addr_fmt, cmn_pth_from_root, clear_ms, make_multisig,
import_ms_wallet, goto_home, pick_menu_item, cap_menu,
nfc_read_text, microsd_path, cap_story, need_keypress,
@ -2750,7 +2750,7 @@ def test_multisig_descriptor_export(M_N, way, addr_fmt, cmn_pth_from_root, clear
except Exception as e:
assert addr_fmt != AF_P2TR
assert M == N == 32
assert str(e) == 'Coldcard Error: badlen'
assert str(e) == 'Coldcard Error: M/N range'
return
# get bare descriptor